Features Potential Measurements in Submicron High Integral Circuits Structures Using Electro-Optical Effect in Liquid Crystals

Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/5501

Title:	Features Potential Measurements in Submicron High Integral Circuits Structures Using Electro-Optical Effect in Liquid Crystals
Other Titles:	Особливості вимірювання потенціалів в субмікронних структурах ВІС з використанням електрооптичного ефекту в рідких кристалах
Authors:	Novosyadlyj, S. Ivasuyk, R. Kotyk, M.
Keywords:	liquid crystals highly integrated circuit automated design system nematic liquid crystals twisteffect
Issue Date:	2017
Publisher:	ФІЗИКА І ХІМІЯ ТВЕРДОГО ТІЛА
Citation:	Kotyk M, Features Potential Measurements in Submicron High Integral Circuits Structures Using Electro-Optical Effect in Liquid Crystals, S. Novosyadlyj, R. Ivasuyk, M. Kotyk,/ PHYSICS AND CHEMISTRY OF SOLIDSTATE – 2017, - V. 18, № 3 (2017) P. 376-381
Abstract:	The quantitative values of electric potentials in the elements of submicron structures High Integral Circuits in the operating mode can be experimentally determined using electro-optic effect in nematics liquid crystal. This method relates to methods of diagnosing electronic structures of High Integral Circuits using Technical System and relates to the technology of Automated Design System and High Integral Circuits.
URI:	http://hdl.handle.net/123456789/5501
ISSN:	1729-4428
Appears in Collections:	Статті та тези (ФТФ)

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