Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/13638
Title: Surface Morphology and Growth Mechanisms of Pb-Cd-Te Thin Films
Authors: Tsymbaliuk, T.
Naidych, B.
Kostyuk, O.
Yavorskyi, Y.
Nykyruy, L.
Yavorskyi, R.
Chernikova, O.
Wisz, G.
Glowa, L.
Найдич, Богдана Петрівна
Костюк, Оксана Богданівна
Яворський, Ярослав Святославович
Никируй, Любомир Іванович
Яворський, Ростислав Святославович
Чернікова, Олена Миколаївна
Цимбалюк, Т. П.
Keywords: Grain size
Grain boundaries
Pb0.9Cd0.1Te
thin films
morphology
film growth
Issue Date: 2021
Publisher: IEEE
Citation: Tsymbaliuk, T., Naidych, B., Kostyuk, O., Yavorskyi, Y., Nykyruy, L., Yavorskyi, R., ... & Glowa, L. (2021, September). Surface Morphology and Growth Mechanisms of Pb-Cd-Te Thin Films. In 2021 IEEE 11th International Conference Nanomaterials: Applications & Properties (NAP) (pp. 1-4). IEEE.
Abstract: The analysis of the surface morphology of Pb 0.9 Cd 0.1 Te:Pb (3 at.%) thin films obtained by the open evaporation in vacuum from pre-synthesized substances are performed. The quantitative composition and sizes of grains on the surface were analyzed. The films have a homogeneous composition and granular structure with individual grain sizes of several tens of micrometers. The introduction of Cadmium into the base matrix PbTe is the cause of the formation of defects such as grain boundaries due to the differ between crystal structure of CdTe and PbTe.
URI: http://hdl.handle.net/123456789/13638
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